ID09 - MS/XPD (Materials Science/X-ray Powder Diffraction) beamline

Overview

MS

 

Welcome to the Materials Science/X-ray Powder Diffraction (MS/XPD) beamline at SESAME.

The MS/XPD beamline is based on components previously installed at the Swiss Light Source donated to SESAME by the Paul Scherrer Institute. It is used for X-Ray Powder Diffraction (XRPD) applications. Its flexible optical design spans a wide energy range of the order of 5 to 25 keV. A two-circle goniometer installed in the experimental hutch accommodates standard XRPD experiments.

At the MS/XPD beamline, the XRPD technique may be applied to material phase identification, quantitative analysis, atomic structural determinations, the characterization of a material’s microstructural properties such as structure imperfections or, domain size, and kinetic studies. 

This beamline, which has been hosting users since December 2020, may be used in a wide range of research fields stretching from materials science and engineering to chemistry, physics, and archeometry.

Information for users

Please cite the following reference paper in all publications that include in any part data obtained at the MS/XPD beamline. The reference papers to be cited in your papers following measurements at the MS/XPD beamline are:

  • “Operational status of the X-ray powder diffraction beam­line at the SESAME synchrotron” 
    M. Abdellatief, M. A. Najdawi, Y. Momani, B. Aljamal, A. Abbadi, M. Harfouche and G. Paolucci J. Synchrotron Rad. (2022). 29. doi.org/10.1107/S1600577521012820

    or
  • “The SESAME materials science beamline for XRD applications” 
    M Abdellatief, L Rebuffi, H Khosroabadi, M Najdawi, T Abu-Hanieh, M Attal, G Paolucci. Powder Diffraction Journal, Vol. 32 - S1, pp. S6-S12 (2017). doi: 10.1017/S0885715617000021